0

Thermal Conductivity Measurements in Atomically Thin Materials and Devices

SpringerBriefs in Applied Sciences and Technology - Nanoscience and Nanotechnolo

Erschienen am 01.05.2020, Auflage: 1. Auflage
CHF 83,90
(inkl. MwSt.)
UVP

Lieferbar in ca. 10-14 Arbeitstagen

In den Warenkorb
Bibliografische Daten
ISBN/EAN: 9789811553479
Sprache: Englisch

Beschreibung

This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects.

Autorenportrait

Dr. Kasirga completed his Ph.D. in December 2013 and right after moved to Bilkent University as an Assistant Prof. Since 2015 he has been serving as associate director of the National Nanotechnology Research Center at Bilkent University. His research interests are in the area of strongly correlated systems and 2D materials.

Weitere Artikel aus der Kategorie "Technik"

Lieferbar innerhalb 36 Stunden

CHF 28,90
inkl. MwSt.
UVP

Lieferbar innerhalb 36 Stunden

CHF 180,00
inkl. MwSt.
UVP

Lieferbar innerhalb 36 Stunden

CHF 47,30
inkl. MwSt.
UVP

Lieferzeit unbestimmt

CHF 93,40
inkl. MwSt.
UVP

Lieferbar innerhalb 36 Stunden

CHF 57,90
inkl. MwSt.
UVP

Nicht mehr lieferbar

CHF 71,00
inkl. MwSt.
UVP
Alle Artikel anzeigen