Adopting a groundbreaking approach, the highly regarded author shows how to design methods for planning increasingly complex experiments. He begins with a brief introduction to standard quality methods and the technology in standard electric circuits. The book then gives numerous examples of how to apply the proposed methodology in a series of real-life case studies. Although these case studies are taken from the printed circuit board industry, the methods are equally applicable to other fields of engineering.

InhaltsangabePART I: Introduction PRINTED CIRCUITS Technology Presentation InnerLayer Processing Materials Preparation Lamination Drilling Making the Hole Conductive Imaging Electroplating Copper Etching Solder Masking Surface Finishing Routing Testing and Inspection Assembling PROBLEM SOLVING FOR RELIABILITY AND QUALITY Conventional Paradigms Complexity and Time Frames Quasilinearity, Circularity, and Closure Advance of Reliability Paradigms PART II: Evolvable Designs of Experiments (EDOE) POLYSTOCHASTIC MODELS What is PSM? Basic Notions for Categorical Frame Illustrative Examples of PSM and Categorical Frames FIRSTORDER WAVE EQUATION Algebraic Frames for Time "T" and Space "Z" The FirstOrder Wave Equation "Kinetic" Model: Walsh-Hadamard Matrices "Convection" Model: Latin Squares Spectral Analysis: Correlation INFORMATIONAL ANALYSIS: EDOE MATRICES WalshHadamard Matrices and Latin Square Designs Classification Procedures: Informational Criteria Informational Entropy and Distances Adaptability in Classification Informational Results Relation with Thermodynamics Ranking, Discarding, and Replication of the Columns Lumping and Splitting Columns Juxtaposing and Cutting Tables of DOE Matrices EDOE METHODOLOGY Scientific and Engineering Methods Center Design and Hierarchy Recursivity and Focusing ProblemSolving Framework for PCB Quality Forward and Backward Search Interactions: Dissociation - Integration EDOE Basic Steps EDOE Frame and SKUP Schema Comparison of EDOE with other Methods PART III: Case Studies SOLDER WICKING Illustrative Failure Analysis Illustrative EDOE Frame SKUP Schema for Solder Wicking RELIABILITY ANALYSIS EDOE for Reliability SKUP Schema for Reliability Reliability Management Systems: Main Elements Reliability Prediction Software Minicoupons Reliability Analysis IST Electrical Resistance Analysis DRILLING Drilling Quality Framework Test Coupons Testing Small Plated Through Holes: SKUP Schema for Drilling Reliability Tests Lifetime Maps Drilling Quality Evaluations Testing the Design, D Testing for Processing, P Reliability Evaluations SURFACE FINISH SOLDERABILITY Finish Solderability Frame SKUP Schema for Surface Finish DIRECT PLATE Direct Plate Reliability Microsectioning Results Electrical Resistance versus the Number of Cycles Classification Method Associated Vectors-Grids First Step of Classification Second Step of Classification IST Lifetime and Electroplated Cu Thickness Summary SKUP Schema for Direct Plate PLATING VOIDS Plating Voids Type The SKUP Schema for Plating Voids PART IV: Evolvability SELFADAPTIVE CIRCUITS Evolvability Levels SelfAdaptivity SelfAdaptive Designs and Constructions SelfAdaptive Materials SelfAdaptive Processing SelfAdaptability to Testing and Field Conditions PROACTIVE CIRCUITS Proactiveness for Circuit Evolutionary Hardware Electrochemical Filament Circuits EVOLVABLE CIRCUITS Evolvability Challenges Molecular Electronics Bacteriorhodopsin for Optoelectronic Circuitry Embedded Symbolic-Connectionists Hybrids Temporal Synchrony for Embedded Symbolic-Connectionist Hybrids Embedded EDOE Hybrid Controlled Microfluidic Circuits Reconfigurable Microfluidic Circuits SelfConstructed Molecular Circuits and Computing Genetic CodeLike Mechanism for Molecular Circuitry Conventional Circuits versus Evolvable Circuits EVOLVABLE MANUFACTURING SYSTEMS Manufacturing Paradigms Fractal Manufacturing System Holonic Manufacturing System Biologic Manufacturing System Virtual Manufacturing System SKUP Schema for Virtual Manufacturing Systems Multiagent Manufacturing Systems: Architecture MuiltiagentBased Versus Conventional Manufacturing Systems PART V: Concluding Remarks RELATED CONCEPTS Complexity Evolvability Polystochastic Method Constructivism Cybernetics and the Cycle of Sciences

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